X-ray diffraction, Shenzhen Railay Technology, Chuzhou provided by X-ray diffraction Railay technology. X-ray diffraction, Shenzhen Railay Technology, Chuzhou X-ray diffraction is Railay Technology Development Co., Ltd. of Shenzhen City (www.inov-x.com) 2014 upgrade been newly launched Crystal Method turnover turnover to monochromatic X-ray crystallography irradiating a single crystal sample is rotated, the rotational axis of the cylindrical sample to the axis of the film records produced by the diffraction lines, discrete diffraction spots formed on the film. Such a diffraction pattern is easy to accurately determine the direction of the diffraction pattern crystal diffraction and diffraction intensity X-ray diffractometer for the unknown crystal structure analysis. Turnover crystal method can easily lower the symmetry of crystal analysis (e.g., orthogonal, monoclinic, triclinic crystal system, etc.) structure, but rarely used. Through experimental analysis, the impact of this article can be obtained powder X-ray diffraction measurements of some factors on the experimental results. Their size (1) powder sample particles have a relatively large impact on the results of X-ray diffraction analysis of test results show that powder sample particles down to 50μm about the results of the measured diffraction was ideal Currently, phase analysis of the problems are mainly:. ⑴ analyte pattern of the strongest lines may not be the strongest line in a single phase, but the result of two or more times with some strong or three strong lines superimposed. In terms of the time line as a phase of the strongest lines will not find any corresponding card. ⑵ identify the condition of the card number of the card in a very complex and cumbersome. Although you can use computer-aided retrieval, but is still far from satisfactory. ⑶ quantitative analysis of the process of Ma'anshan X-ray diffraction, sample preparation, calibration curve plotted or K value measurement and calculation, are complex and difficult task. For this reason, it was suggested that a possible solution that from the opposite perspective, according to the standard data (PDF card) using computer qualitative analysis of the preliminary results of a multiphase fitting display Chuzhou carried X-ray diffraction, diffraction angle and draw simulated diffraction diffraction intensity curve. By adjusting the proportion of each phase, compared with the diffraction scan obtained diffraction pattern can be obtained more accurately the results of qualitative and quantitative analysis, thus eliminating some of the qualitative analysis and quantitative analysis of the experimental and calculated process.