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Information Name: | X-ray diffraction _ Shenzhen Railay Technology _ Bozhou X-ray diffractometer |
Published: | 2014-05-30 |
Validity: | 0 |
Specifications: | Limitation |
Quantity: | |
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Detailed Product Description: | Characteristic X-ray diffraction and X-rays having a wavelength (0.06-20nm) chizhou short X-ray diffraction of electromagnetic waves can penetrate the material of a certain thickness, and the fluorescent substance can emit light, a camera sensitive emulsion, gas ionization. Metals with high-energy electron beam generating X-ray target, the target having an element corresponding to a specific wavelength, called the characteristic X-rays. Such as copper target X-ray wavelength corresponding to 0.154056 nm Product Name: Portable X-ray diffraction (XRD) Terra Model: XRD-Terra Application Description: The main phase analysis provides crystal structure analysis, analysis of the crystal unit cell parameters substances, Stress Analysis Download: Download Brand: Innov-x Origin: USA Typical user: Research, University Currently, phase analysis of the main problems are: ⑴ analyte pattern of the strongest lines may not be the most in a single-phase strong line, but two or more times stronger with some strong wire or three superimposed results. In terms of the time line as a phase of the strongest lines will not find any corresponding card. ⑵ identify the condition of the card number of the card in a very complex and cumbersome. Although you can use computer-aided retrieval, but is still far from satisfactory. ⑶ quantitative analysis, sample preparation, calibration curve plotted or K value measurement and calculation, are complex and difficult task. For this X-ray diffraction, it was suggested that a possible solution, consider starting Bozhou X-ray diffraction from the opposite point of view, according to the standard data (PDF card) using computer qualitative analysis of the preliminary results of the multiphase fitting display, painted the simulated diffraction pattern of the diffraction angle and diffraction intensity. By adjusting the proportion of each phase, compared with the diffraction scan obtained diffraction pattern can be obtained more accurately the results of qualitative and quantitative analysis, thus eliminating some of the qualitative analysis and quantitative analysis of the experimental and calculated process. X-ray diffraction _ Shenzhen Railay Technology _ Bozhou provided by X-ray diffraction Railay technology. Railay Technology Development Co., Ltd. of Shenzhen City (www.inov-x.com) in ore analyzer, alloy analyzer, environmental analyzers, portable GC-MS and other industries have high visibility, integrity management, both quality of service, Welcome to inquire, or consult our "Business League call" it! |
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Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
AllSources Network's Disclaimer: The legitimacy of the enterprise information does not undertake any guarantee responsibility
You are the 16782 visitor
Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
AllSources Network's Disclaimer: The legitimacy of the enterprise information does not undertake any guarantee responsibility