Diffractometer X-ray diffractometer with Bragg experimental prototype, combining the results of many mechanical and electronic technology. Diffractometer consists of four basic parts of the X-ray generator, X-ray goniometer, radiation detectors and radiation detection circuit, is characterized by X-ray irradiation of polycrystalline samples of X-ray diffraction, and diffraction radiation detectors record the information diffraction experiment devices. Modern X-ray diffractometer control operations and run the software comes with the computer system. The same X-ray diffraction imaging principle and aggregation method rambling X-ray diffraction, but the recording mode and the corresponding diffraction pattern obtained different. Diffractometer using a certain divergence of the incident ray Xining X-ray diffraction, but also focus on using "arc circumferential angle with the same circumference equal" principle, different is its focus radius with 2θ of changes. Diffractometer with its convenient, fast, accurate and automatic data processing features to replace the photographic method in many areas, has now become the main method for crystal structure analysis work. West Coast near perfect crystal X-ray diffraction, defect, such as distortion in the X-ray spectrum of the reflected only tens of seconds of arc, and the epitaxial growth of semiconductor material required to achieve the lattice mismatch 10-4 or less. Such requirements make a fine double-crystal X-ray diffraction techniques of modern optoelectronic materials and devices become essential to develop measurement instruments to double crystal diffraction technology-based and developed four and five crystal crystal diffraction techniques (also known as double-crystal diffraction) , has become the modern X-ray diffraction technology has made outstanding achievements in sign. But double-crystal diffractometer best second crystal is the same kind with the first crystal crystal dispersion would otherwise occur. Therefore, when measuring, double crystal diffractometer reference crystal to crystal and measured the same, this requirement makes the use of double-crystal diffractometer is restricted. [] X-ray diffraction, X-ray diffraction rambling, Shenzhen Science and Technology provided by Railay Railay technology. Welcome to consult Shenzhen Science and Technology Development Co., Ltd. Railay (www.inov-x.com), be sure to specify when contact is through the "Business Alliance Member" see, thank you! Contact: Miss Tang