Welcome To b2b168.com, Join Free | Sign In
中文(简体) |
中文(繁體) |
Francés |Español |Deutsch |Pусский |
| No.9753163

- Product Categories
- Friendly Links
- home > Supply > [] _ X-ray diffractometer X-ray diffractometer _ Zhongshan, Shenzhen Railay Technology
Information Name: | [] _ X-ray diffractometer X-ray diffractometer _ Zhongshan, Shenzhen Railay Technology |
Published: | 2014-06-04 |
Validity: | 0 |
Specifications: | Limitation |
Quantity: | |
Price Description: | |
Detailed Product Description: | Debye law characteristic with a collimated X-ray irradiation to the small powder samples, using rolled into a cylindrical shape and install coaxial sample strips film recording diffraction information Huizhou X-ray diffraction, the diffraction pattern obtained some diffraction arc. The advantage of this method is: ⑴ sample used less (0.1 mg to); ⑵ sample contains all reflected rays generated; ⑶ devices and technology is relatively simple. XRD-Terra is designed for NASA (NASA) developed a portable, automated X-ray diffraction (XRD), for the detection and analysis of ore samples of Martian soil samples to determine the geological formation of Mars, and support The presence of microorganisms and environmental conditions for analysis of organic compounds. Has equipped with "Spirit" and "Opportunity" Zhongshan X-ray diffractometer, successfully completed a geological expedition to Mars. In grain size and lattice distortion measurement process needs to be done two: ⑴ derived from pure linear diffraction experiments linear, the most common approach is to repeat the continuous Fourier transform and convolution. ⑵ grain size and defect information obtained from the appropriate lines in the diffraction pattern. This step is mainly to identify the various factors that make the line broadening, and the separation of the impact of these factors on the width of the X-ray diffraction, to calculate the desired results. The main methods of Fourier method, linear variance method and integral width method. ? Integration transmission geometry using diffraction techniques and high-sensitivity CCD detectors, XRD and XRF detection simultaneously provide structural information to detect and elemental composition of the material information. . [] _ X-ray diffractometer X-ray diffractometer _ Zhongshan, Shenzhen Science and Technology provided by Railay Railay technology. Welcome to consult Shenzhen Science and Technology Development Co., Ltd. Railay (www.inov-x.com), be sure to specify when contact is through the "Business Alliance Member" see, thank you! Contact: Miss Tang |
Admin>>>
You are the 16782 visitor
Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
AllSources Network's Disclaimer: The legitimacy of the enterprise information does not undertake any guarantee responsibility
You are the 16782 visitor
Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
AllSources Network's Disclaimer: The legitimacy of the enterprise information does not undertake any guarantee responsibility