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Information Name: | Shenzhen Railay Technology _ X-ray diffraction [Bristol] _X-ray diffractometer |
Published: | 2014-06-04 |
Validity: | 0 |
Specifications: | Limitation |
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Detailed Product Description: | Shenzhen Railay Technology _ X-ray diffraction [Bristol] _X-ray diffractometer provided by Railay technology. We are Shenzhen Railay Technology Development Co., Ltd. (www.inov-x.com) is located: Shenzhen, Guangdong specializes in: ore analyzer, alloy analyzer, environmental analyzers, portable GC-MS method turnaround turnaround crystal to crystal method monochromatic X-ray single-crystal samples were irradiated Tianmen rotating X-ray diffractometer for sample rotation axis is the axis of the cylindrical film records generated diffraction lines, forming discrete diffraction spots on the film. Such easily and accurately measured diffraction pattern and the diffraction direction of the diffraction intensity of the diffraction pattern of the crystal of the unknown crystal structure suitable for analysis. Turnover crystal method can easily lower the symmetry of crystal analysis (e.g., orthogonal, monoclinic, triclinic crystal system, etc.) structure, but rarely used. Through experimental analysis, the impact of this article can be obtained powder X-ray diffraction measurements of some factors on the experimental results. Their size (1) powder sample particles have a relatively large impact on the results of X-ray diffraction analysis of test results show that powder sample particles down to 50μm about the results of the measured diffraction was better. determination of grain size and lattice distortion if the grain polycrystalline materials without distortion, large enough X-ray diffraction, powder diffraction theory, which pattern of spectral lines should be particularly sharp, but in actual experiments Xiantao X-ray diffraction, this line can not be seen. This is because the combined effect of factors and physical factors such as instrument, so that the pure diffraction line broadening. Pure spectral line shape and width is determined by the average grain size of the sample, the size distribution and defects in the crystal lattice of the main Qianjiang X-ray diffraction, it is appropriate for linear analysis, these factors can be obtained on the nature of the principle of and scales and other information. ? Trace detector test sample only 15mg, especially suitable for detection and analysis of criminal investigation, environmental, explosives, pipe corrosion and other difficult to collect samples. |
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Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
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You are the 16782 visitor
Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
AllSources Network's Disclaimer: The legitimacy of the enterprise information does not undertake any guarantee responsibility