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Information Name: | [] X-ray diffraction, X-ray diffraction Jingzhou, Shenzhen Railay Technology |
Published: | 2014-06-05 |
Validity: | 0 |
Specifications: | Limitation |
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Detailed Product Description: | X-ray diffraction is the use of diffraction theory, accurate determination of the crystal structure of the material, texture and stress, accurate phase analysis, qualitative analysis, quantitative analysis. Widely used in metallurgy, petroleum, chemical, scientific research, aerospace, education, material production, etc. affect the particle size of the sample results in order to more fully illustrate the extent of the particle size effect on the test results, we selected from 内蒙古巴丹Jaran desert surface mineral samples to be analyzed. using Rigaku (Rigaku) ??produced D/Max2400 multi-crystal X-ray diffraction test. Cu target (λ = 0. 154056 nm), tube voltage 40 kV, tube current 60 mA, scanning speed of 10 deg. / min Yichang X-ray diffraction, in steps of 0. 02 °, DS (divergence slit) = SS (anti-scatter slit) = 1 °, RS (receiving slit) = 0 . 3 mm. were milled and sieved to sample the full X-ray diffraction, the fineness of the samples were from small to large 45,48,58,75,150 μm 5 levels Xiangyang X-ray diffraction, X-ray diffraction analysis of the obtained results are shown in Fig.1. can be seen from the figure, the particle size of 150μm weakest sample peaks, the strongest diffraction back end part of the content of the weak diffraction peaks of the sample substance is not swept out. the particle size of 75,58, Samples 48 and 45μm with decreasing particle size, the larger the diffraction intensity constantly diffraction peak of trace elements in the material becomes gradually stronger. crystallography single crystal sample turnaround turnaround monochromatic X-ray crystallography to rotate the irradiation, Sample rotation axis as the axis for a cylindrical film produced by recording the diffraction lines of the diffraction spots formed on the separation film. Such easily and accurately measured diffraction pattern and the diffraction direction of the diffraction intensity of the diffraction pattern of the crystal of the unknown crystal structure suitable for analysis. Turnover crystal method can easily lower the symmetry of crystal analysis (e.g., orthogonal, monoclinic, triclinic crystal system, etc.) structure, but rarely used. Jingzhou experimental analysis of X-ray diffraction, the paper can be obtained powder X-ray diffraction measurements influence of some factors on the experimental results. (1) the size of their particles of powder samples have a relatively large impact on the X-ray diffraction analysis of test results. Experimental results show that the powder sample particles down to about 50μm, the results of the measured diffraction was better.] [X-ray diffraction, X-ray diffraction Jingzhou, Shenzhen Railay Railay technology provided by technology. Welcome to consult Shenzhen Science and Technology Development Co., Ltd. Railay (www.inov-x.com), be sure to specify when contact is through the "Business Alliance Member" see, thank you! Contact: Miss Tang |
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Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
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You are the 16782 visitor
Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
AllSources Network's Disclaimer: The legitimacy of the enterprise information does not undertake any guarantee responsibility