The new development direction of X-ray analysis, X-ray analysis due to the popularity of metal equipment and technology has gradually become metallic and organic materials research, conventional methods of nanomaterials tests. But also for dynamic measurements. Early multi photographically Hezhou X-ray diffraction, low accuracy of this method takes longer Fangchenggang X-ray diffraction, the intensity measurements. Early 1950s the advent of counter diffractometer with fast, accurate intensity measurements, and is equipped with computer control, etc., have been widely used. But the photographic method using a monochromator in the analysis of trace samples and explore the unknown still new phase in their characteristics. Since the 1970s, along with high-intensity X-ray source (including super-strength rotating anode X-ray generator, electronic synchrotron radiation, high-voltage pulse X-ray source) and the emergence of high-sensitivity detectors and computer analysis of the application, the metal X-ray science gain new impetus. The combination of new technologies, not only greatly accelerate the speed of analysis, improve accuracy, and can be instantaneous dynamic observation and more faint or fine effect on research. Overview of Crystal Materials, X-ray diffraction method is very effective guests ideal X-ray diffraction, and for liquids and amorphous solids, this method can also provide many basic important data. Therefore, X-ray diffraction study of the solid is considered the most effective tool. In various diffraction methods, the basic method of single crystal method, polycrystalline and double crystal method. Focus combines geometric goniometer principle [4], the results of the diffraction analysis, the case only with the sample holder filled with the sample surface level in order to ensure that the sample surface during the scanning process and the focus is always tangent to the circle, so that the sample surface and Focus circle has the same curvature, the detector receives a brief scan process to harness more diffraction, thereby enhancing the intensity of the diffraction lines, improve the measurement accuracy, so when filling the sample and the sample holder diffraction peak intensity maximum level, Octavia peak shape and most X-ray diffractometer, back at the end of the weakest, while most of the samples above and below when filling the sample holder plane (hk not satisfied goniometer focusing geometric principles, scanning probe received The signal is relatively weak, so the performance of the diffraction pattern is weaker peak intensity and a higher back end. these two kinds of sample loading methods are our measurements should try to avoid.] [X-ray diffraction, X-ray Fangchenggang diffractometer, Shenzhen Science and Technology provided by Railay Railay technology. welcome advice Railay Shenzhen Science and Technology Development Co., Ltd. (www.inov-x.com), be sure to specify when contact is through the "Business Alliance Member" see, Thank you Contact:! KOKO