[] X-ray diffraction, X-ray diffraction Wuzhou, Shenzhen Railay Railay technology provided by technology. Railay Technology Development Co., Ltd. of Shenzhen City (www.inov-x.com) have been "Business League certification", please rest assured purchase through the entire network, click on the page check "Business League certification icon," the company authentication information. You can also click on the "Business League Service Icons" on this page directly contact our customer service! The new development direction of X-ray analysis, X-ray analysis due to the popularity of metal equipment and technology has gradually become metallic and organic materials research, conventional methods of nanomaterials tests. But also for dynamic measurements. Early multi-use photographic method, this method takes longer low accuracy Wuzhou X-ray diffraction, the intensity measurements. Early 1950s the advent of counter diffractometer with fast, accurate intensity measurements, and is equipped with computer control, etc., have been widely used. But the photographic method using a monochromator in the analysis of trace samples and explore the unknown still new phase in their characteristics. Since the 1970s, along with high-intensity X-ray source (including super-strength rotating anode X-ray generator, electronic synchrotron radiation, high-voltage pulse X-ray source) and the emergence of high-sensitivity detectors and computer analysis of the application, the metal X-ray science gain new impetus. The combination of new technologies, not only greatly accelerate the speed of analysis Liuzhou X-ray diffractometer, improve accuracy, and can be instantaneous dynamic observation and more faint or fine effect on research. Double-crystal diffraction double crystal diffractometer with a beam of X-rays (usually Ka1 as a radiation source) irradiation of a reference surface of the crystal, so that compliance with the conditions of a Bragg wavelength X-rays are reflected in a small range of angles, thus get close to being polarized monochromatic and narrow reflection lines, then the appropriate aperture limitation Nanning X-ray diffraction, we get almost quasi-value X-ray beam. This X-ray as the second crystal ray, the second transistor and the counter near the diffraction position respectively Δθ and Δ (2θ) angle of the swing, the formation of the usual double-crystal diffractometer. § Terra performance and specifications. As X-ray diffraction (XRD) product family, a subversive, compared with traditional desktop XRD, Innov-x Terra has the following advantages, portable body:? 485 x 392 x 192 mm Weight: 14.5 kg (including 4 battery), suitable for field site operations, small footprint, low purchase and maintenance costs.