Lloyd et al, 1912 According to the theory predicted and experimentally confirmed the encounter can occur when the X-ray crystal diffraction, X-rays have proved that the electromagnetic properties of Jiayuguan X-ray diffraction, the first milestone in the X-ray diffraction studies. When a monochromatic X-rays incident on the crystal, the crystal is composed of atoms in a unit cell arranged in Gannan rule X-ray diffraction, the interatomic distance of the ordered X-ray wavelength of the incident X-ray diffraction analysis of the same magnitude, Therefore, different atomic scattering of X-rays interfere with each other, resulting in a strong X-ray diffraction, the diffraction lines in the orientation and intensity spatial distribution is closely related to the crystal structure in some particular direction. This is the basic principle of X-ray diffraction. Relationship between the spatial orientation of the diffraction lines of the crystal structure is available Bragg equation: 2dsinθ = nλ where: λ is the wavelength of X-rays; θ is the diffraction angle; d is the crystal plane spacing; n is an integer. A known wavelength λ of X-ray diffraction angle measurement thus obtained spacing, i.e., atoms or ions in the crystalline ordered state. X-ray diffraction to determine the strength and surface interval table with known control sample to determine the crystal structure of matter, namely qualitative analysis. Comparison of X-ray diffraction intensity from the quantitative analysis can be performed. Currently, phase analysis main problems are: ⑴ analyte pattern of the strongest lines may not be the strongest line in a single phase, but some times two or more strong-phase or three strong lines superimposed results. In terms of the time line as a phase of the strongest lines will not find any corresponding card. ⑵ identify the condition of the card number of the card in a very complex and cumbersome. Although you can use computer-aided retrieval, but is still far from satisfactory. ⑶ quantitative analysis, sample preparation, calibration curve plotted or K value measurement and calculation, are complex and difficult task. For this reason, it was suggested that a possible solution X-ray diffractometer, considered from the opposite point of view, according to the standard data (PDF card) using computer qualitative analysis of the preliminary results of a multiphase fitting display Zhengzhou performed X-ray diffraction, painted the simulated diffraction pattern of the diffraction angle and diffraction intensity. By adjusting the proportion of each phase, compared with the diffraction scan obtained diffraction pattern can be obtained more accurately the results of qualitative and quantitative analysis, thus eliminating some of the qualitative analysis and quantitative analysis of the experimental and calculated process. [] X-ray diffraction, X-ray diffraction, Zhengzhou, Shenzhen Railay Railay technology provided by technology. Welcome to consult Shenzhen Science and Technology Development Co., Ltd. Railay (www.inov-x.com), be sure to specify when contact is through the "Business Alliance Member" see, thank you! Contact: Miss Tang