X-ray diffraction | White Mountain X-ray diffraction | Technology provided by Shenzhen Railay Railay technology. Railay Technology Development Co., Ltd. of Shenzhen City (www.inov-x.com) is Shenzhen, Guangdong Business League certification of quality companies, with Terry, Enos and other brands, has a good reputation, honesty, service-oriented, and click on the page The "Business League Support" icon, we will be happy to serve you! Characteristic X-ray diffraction and X-rays having a wavelength (0.06-20nm) short electromagnetic waves can penetrate the material of a certain thickness, and make the fluorescent substance emits light, a camera sensitive emulsion, gas ionization. Metals with high-energy electron beam generating X-ray target, the target having an element corresponding to a specific wavelength, called the characteristic X-rays. Such as copper target X-ray wavelength corresponding to 0.154056 nm Product Name: Portable X-ray diffraction (XRD) Terra Model: XRD-Terra Application Description: The main phase analysis provides crystal structure analysis, analysis of the crystal unit cell parameters substances, Stress Analysis Download: Download Brand: Innov-x Origin: USA Typical users: Research, University X-ray diffractometer using diffraction theory Liaoyuan X-ray diffractometer, accurate determination of the crystal structure of the material, texture, stress and precise phase analysis, qualitative analysis, quantitative analysis. Widely used in metallurgy, petroleum, chemical, scientific research, aerospace, education, material production, etc. affect the particle size of the sample results in order to more fully illustrate the extent of the particle size effect on the test results, we selected from 内蒙古巴丹Jaran desert surface mineral samples to be analyzed. using Rigaku (Rigaku) ??produced D/Max2400 multi-crystal X-ray diffraction test. Cu target (λ = 0. 154056 nm), tube voltage 40 kV, tube current 60 mA X-ray diffraction, scanning speed of 10 deg. / min, in steps of 0. 02 °, DS (divergence slit) = SS (anti-scatter slit) = 1 ° Hakusan X-ray diffraction, RS (reception narrow seam) = 0. 3 mm. respectively, fully milled and sieved samples, samples from small to large fineness were 45,48,58,75,150 μm 5 levels Tonghua X-ray diffraction, X-ray diffraction analysis of the obtained results are shown in Fig.1. can be seen from the figure, the particle size of 150μm weakest sample peaks, the strongest diffraction back end part of the content of the weak diffraction peaks of the sample substance is not swept out. the particle size of 75,58, Samples 48 and 45μm with decreasing particle size, the larger the diffraction intensity constantly diffraction peak of trace elements in the material becomes gradually stronger.