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- home > Supply > [] _ X-ray diffractometer X-ray diffractometer _ Lawrence Shenzhen Railay Technology
Information Name: | [] _ X-ray diffractometer X-ray diffractometer _ Lawrence Shenzhen Railay Technology |
Published: | 2014-06-11 |
Validity: | 0 |
Specifications: | Limitation |
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Detailed Product Description: | § has the following binding innovation? Transmission diffraction geometry technology. ? Sample vibration technology. ? The two-dimensional area detector, 2D-XRD techniques. ? XRD and XRF integration technology. ? Electronic refrigeration technology. ? XRD-Terra breaking the traditional composition. § Terra has the following characteristics portable use: Body: 485 x 392 x 192 mm Weight: 14.5 kg; instrument comes with a battery system that can be realized in the Field detection and analysis; portable XRD world's first true sense?. ? With a simple, no professionals to operate. ? Detect fast Qiannan X-ray diffraction, 3 minutes to complete the test sample. ? Maintenance cost, no water cooling system and constant temperature environment without specialized laboratories, no supplies accessories. ? Trace of the sample needs about 15mg, less sample or samples is particularly suitable for the detection of precious Liupanshui X-ray diffractometer, such as archeology, forensic, pipeline corrosion analysis. ? Environmental adaptability, can be moisture, dust and shock. The crystals were collected by the counter direction of the diffraction and the diffraction intensity data, the identification phase or crystal structure analysis instrument (Figure 1). Polycrystalline and single crystal X-ray diffraction X-ray four-circle diffractometer. X-ray diffraction X-ray generator consists of three parts, goniometer and detection recording system, etc. (Figure 2). Its working principle is: the powder sample was a bunch of parallel vertical monochromatic X-rays after irradiation, resulting in a group of the incident ray reflection axis coaxial conical surface X-ray diffraction Lawrence family, counter rotating around the sample, in order to measure each reflecting conical surface 2θ angle (ie, the diffraction angle, also known as Bragg angle) diffraction line intensity position, you can get all kinds of diffraction data characterization phase, so research phase identification and crystal structures. [] _ X-ray diffractometer X-ray diffractometer _ Lawrence Shenzhen Technology provided by Railay Railay technology. Welcome to consult Shenzhen Science and Technology Development Co., Ltd. Railay (www.inov-x.com), be sure to specify when contact is through the "Business Alliance Member" see, thank you! Contact: Miss Tang |
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Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
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You are the 16782 visitor
Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
AllSources Network's Disclaimer: The legitimacy of the enterprise information does not undertake any guarantee responsibility