[] _ X-ray diffraction X-ray diffraction _ Datong Shenzhen Technology provided by Railay Railay technology. Railay Technology Development Co., Ltd. of Shenzhen City (www.inov-x.com) have been "Business League certification", please rest assured purchase through the entire network, click on the page check "Business League certification icon," the company authentication information. You can also click on the "Business League Service Icons" on this page directly contact our customer service! Model: XRD-Terra Nature of the Firm: Authorized Dealer Applications: XRD-Terra is the world's first portable analyzer XRD-Terra true sense is designed for NASA (NASA) developed a portable, automated X ray diffraction (XRD), for the detection and analysis of ore samples of Martian soil samples to determine the geological formation of Mars Anshun X-ray diffraction, and the support of micro-organisms present in organic compounds and environmental conditions were analyzed. Has equipped with "Spirit" and "Opportunity", successfully completed a geological expedition to Mars. XRD-Terra is the world's first portable analyzer real sense, the U.S. NASA patent -7113265. Currently Datong X-ray diffraction phase analysis of the main problems are: ⑴ analyte strongest lines in the pattern may not be the strongest line in a single phase, but two or more times with some strong or the result of three strong lines superimposed. In terms of the time line as a phase of the strongest lines will not find any corresponding card. ⑵ identify many cards in the card to meet the conditions in southwest Guizhou X-ray diffraction, is very complex and cumbersome. Although you can use computer-aided retrieval, but is still far from satisfactory. ⑶ quantitative analysis, sample preparation, calibration curve plotted or K value measurement and calculation, are complex and difficult task. For this reason, it was suggested that a possible solution X-ray diffractometer, considered from the opposite perspective, according to the standard data (PDF card) preliminary results of the use of computer qualitative analysis carried multiphase fitting display, draw diffraction angle diffraction simulated diffraction intensity curve. By adjusting the proportion of each phase, compared with the diffraction scan obtained diffraction pattern can be obtained more accurately the results of qualitative and quantitative analysis, thus eliminating some of the qualitative analysis and quantitative analysis of the experimental and calculated process.