[] X-ray diffraction, X-ray diffraction Jinzhong, Shenzhen Railay Railay technology provided by technology. Railay Technology Development Co., Ltd. of Shenzhen City (www.inov-x.com) have been "Business League certification", please rest assured purchase through the entire network, click on the page check "Business League certification icon," the company authentication information. You can also click on the "Business League Service Icons" on this page directly contact our customer service! Editing basic structure in the form of X-ray diffractometer X-ray diffractometer variety of different purposes, but the basic structure is very similar to Figure 4 for the X-ray diffraction diagram of the basic structure, the main components include four parts. (1) X-ray source with high stability required for the measurement of X-rays provide Jinzhong X-ray diffraction, X-ray tube anode changing the target material can change the wavelength of X-ray X-ray diffraction Jincheng, adjust the anode voltage can be controlled X-ray source strength. (2) adjusting the system samples the sample position and the orientation of the sample bodies shall be a single crystal, powder, polycrystalline or microcrystalline solid mass. (3) diffracted ray detector simultaneously detecting the intensity or direction of the diffraction, the diffraction pattern can be obtained polycrystalline instrument measurement data recording system or the computer processing system. Processing and analysis system (4) diffraction pattern of modern X-ray diffractometer are installed with a dedicated diffraction pattern processing and analysis software for computer systems, they are characterized by automation and intelligent. X-ray stress measurement to measurement of stress changes characteristic diffraction pattern as a measure of strain. Macroscopic stress evenly distributed within the range of the larger objects, that uniform strain performance within the same range produced by the crystal orientation plane of the same name in the same pitch changes, resulting in a direction of displacement of the diffraction line, which is the X-ray stress measuring macro basis; among the microscopic stress even in the crystal grains of a partially different from each other between the X-ray diffraction yangquan uneven strain is generated in the performance of certain areas of the interplanar spacing increases, reducing the distance between certain regions of the crystal surface results diffraction lines in different directions so that the displacement to diffuse diffraction line broadening, which is the basis of X-ray measurement of microscopic stress. Ultra-microscopic stress strain to make atomic deviation from the equilibrium position of the region, leading to weakening of the diffraction lines, the ultra-microscopic stress can be measured by changes in X-ray intensity. Stress is generally measured by diffractometer.