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Information Name: | X-ray diffraction, X-ray diffraction Qujing, Railay Technology Shenzhen |
Published: | 2014-06-13 |
Validity: | 0 |
Specifications: | Limitation |
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Detailed Product Description: | Diffractometer X-ray diffractometer with Bragg experimental prototype, combining the results of many mechanical and electronic technology. Diffractometer consists of four basic parts of the X-ray generator, X-ray goniometer, radiation detectors and radiation detection circuit Qujing X-ray diffraction, X-ray irradiation is characterized by a polycrystalline sample of X-ray diffraction, and radiation detection records the diffraction experimental diffraction information. Modern X-ray diffractometer control operations and run the software comes with the computer system. The same X-ray diffraction imaging principle and aggregation method, but the recording mode and the corresponding diffraction pattern obtained different. Using a diffractometer with a divergence of incident rays, but also for focusing "with the same circumferential angle on the circumference of the arc is equal to" principle, which is different with the focusing radius of 2θ changes. Diffractometer with its convenient, fast, accurate and automatic data processing features to replace the photographic method Dali X-ray diffraction in many areas, has now become the main method for crystal structure analysis work. In grain size and lattice distortion measurement process needs to be done two: ⑴ derived from pure linear diffraction experiments linear, the most common approach is to repeat the continuous Fourier transform and convolution. ⑵ grain size and defect information obtained from the appropriate lines in the diffraction pattern. This step is mainly to identify the various factors that make the line broadening, and the separation of the effects of these factors on the width of Lijiang X-ray diffraction, to calculate the desired results. The main methods of Fourier method, linear variance method and integral width method. ? Integration transmission geometry using diffraction techniques and high-sensitivity CCD detectors, XRD and XRF detection simultaneously provide structural information to detect and elemental composition of the material information. . X-ray diffraction, X-ray diffraction Qujing, Railay Railay technology provided by the Shenzhen Science and Technology. This information consists of: Railay Technology Development Co., Ltd. of Shenzhen City (www.inov-x.com) offer, we are Commercial Union membership, the integrity of the whole network authentication provider. Feel free to contact us, Contact: Miss Tang |
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Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
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You are the 16782 visitor
Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
AllSources Network's Disclaimer: The legitimacy of the enterprise information does not undertake any guarantee responsibility