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Information Name: | X-ray diffraction, X-ray diffraction, Devon, Railay Technology Shenzhen |
Published: | 2014-06-13 |
Validity: | 0 |
Specifications: | Limitation |
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Detailed Product Description: | X-ray diffraction, X-ray diffraction, Devon, Railay Railay technology provided by the Shenzhen Science and Technology. Railay Technology Development Co., Ltd. of Shenzhen City (www.inov-x.com) is Shenzhen, Guangdong Business League certification of quality companies, with Terry, Enos and other brands, has a good reputation, honesty, service-oriented, and click on the page The "Business League Support" icon, we will be happy to serve you! § has the following binding innovation? Transmission diffraction geometry technology. ? Sample vibration technology. ? The two-dimensional area detector, 2D-XRD techniques. ? XRD and XRF integration technology. ? Electronic refrigeration technology. ? XRD-Terra breaking the traditional composition. § Terra has the following characteristics portable use: Body: 485 x 392 x 192 mm Weight: 14.5 kg; instrument comes with a battery system that can be realized in the Field detection and analysis; portable XRD world's first true sense?. ? With a simple X-ray diffractometer, without professional operation. ? Rapid, 3 minutes to complete the test sample. ? Maintenance cost, no water cooling system and constant temperature environment without specialized laboratories, no supplies accessories. ? Trace of the sample needs about 15mg Zhaotong X-ray diffraction, X-ray diffraction, Devon particular, such as archeology, forensic, pipeline corrosion analysis suitable for the detection of precious little sample or samples. ? Environmental adaptability Wenshan X-ray diffraction, can be moisture, dust and shock. In grain size and lattice distortion measurement process needs to be done two: ⑴ derived from pure linear diffraction experiments linear, the most common approach is to repeat the continuous Fourier transform and convolution. ⑵ grain size and defect information obtained from the appropriate lines in the diffraction pattern. This step is mainly to identify the various factors that make the line broadening, and the separation of the effects of these factors on the width to calculate the desired results. The main methods of Fourier method, linear variance method and integral width method. ? Integration transmission geometry using diffraction techniques and high-sensitivity CCD detectors, XRD and XRF detection simultaneously provide structural information to detect and elemental composition of the material information. . |
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Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
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You are the 16782 visitor
Copyright © GuangDong ICP No. 10089450, Science and Technology Development Co., Ltd. of Shenzhen City Railay All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
AllSources Network's Disclaimer: The legitimacy of the enterprise information does not undertake any guarantee responsibility